Retailer's panel and expert system

Date of publication: June 15, 1990

Abstract:

We show how using one expert system allows us to go further and quicker in the analysis of the enormous amount of data collected by scanner in a sample of stores. In particular the first step of our research is to be able to condense, to structure this data in a automatically generated report, underlining the significant elements.

Jean Pierre Gaucher

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Patrick Le Maire

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Isabelle Le Roy

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Gilles Mauffrey

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Jacques Obadia

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